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#1

The use of electrochemical scanning tunnelling microscopy (EC-STM) in corrosion analysis: Reference material and procedural guidelines (EFC 44) (European Federation of Corrosion Publications)

R Lindstrom, V. Maurice, L Klein, P. Marcus

Категория: Химия

1.79 Mb

#2

Methods of Experimental Physics: Scanning Tunneling Microscopy (Experimental Methods in the Physical Sciences)

Joseph A. Stroscio

23.77 Mb

#3

Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy: Route to Femtosecond Ångstrom Technology (Springer Series in Optical Sciences) (v. 99)

Mikio Yamashita, Hidemi Shigekawa, Ryuji Morita

11.19 Mb

#4

The Use of Electrochemical Scanning Tunnel Microscopy (Ec-stm) in Corrosion Analysis: Reference Material and Procedural Guidelines (Efc 44)

R. Lindstrom, V. Maurice, L. Klein

19.05 Mb

#5

Scanning tunneling microscopy and its applications

Chunli Bai

124.66 Mb

#6

Atomic Force Microscopy Scanning Tunneling Microscopy

Samuel H. Cohen, Marcia L. Lightbody

4.66 Mb

#7

The use of electrochemical scanning tunnelling microscopy (EC-STM) in corrosion analysis: Reference material and procedural guidelines

Lindstrom R., Maurice V., Klein L.H.

18.80 Mb

#8

Mono-Cycle photonics and optical scanning tunneling microscopy

Mikio Yamashita, Hidemi Shigekawa, Ryuji Morita

11.19 Mb

#9

Scanning Tunneling Microscopy in Surface Science, Nanoscience and Catalysis

Michael Bowker, Philip R. Davies

Категория: P_Physics, PS_Solid state, PSa_Applications

9.50 Mb

#10

Introduction to scanning tunneling microscopy

Категория: Ch_Chemistry

5.55 Mb

#11

Introduction to Scanning Tunneling Microscopy

C. Julian Chen

15.40 Mb

#12

Nanoscale characterization of surfaces and interfaces

N. John DiNardo

Категория: 'Surfaces (Physics)', 'Scanning tunneling microscopy.', 'Nanotechnology.', 'Scanning tunneling microscopy.', 'Nanostructuren.', 'Oppervlakken.', 'Grenslagen.'

14.01 Mb

#13

Surface analysis with STM and AFM: experimental and theoretical aspects of image analysis

Sergei N. Magonov, Myung-Hwan Whangbo

Категория: 'Surfaces (Technology) -- Analysis.', 'Scanning tunneling microscopy.', 'Atomic force microscopy.', 'Metals -- Surfaces -- Analysis.', 'Semiconductors -- Testing.', 'Electric insulators and insulation -- Testing.', 'Scanning tunneling microscopy.'

19.56 Mb