An Introduction To Surface Analysis By XPS And AES
John F. Watts, John Wolstenholme
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.
Ссылка удалена правообладателем
----
The book removed at the request of the copyright holder.
