Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

Скачать книгу бесплатно (pdf, 12.09 Mb)

---

Читать «An introduction to surface analysis by XPS and AES»