|
|
libcats.org
Fundamentals of Semiconductor Manufacturing and Process ControlGary S. May, Costas J. SpanosA practical guide to semiconductor manufacturing from process control to yield modeling and experimental design
Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and management of overall manufacturing systems * Chapters include case studies, sample problems, and suggested exercises * Instructor support includes electronic copies of the figures and an instructor's manual Graduate-level students and industrial practitioners will benefit from the detailed exami?nation of how electronic materials and supplies are converted into finished integrated circuits and electronic products in a high-volume manufacturing environment. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. An Instructor Support FTP site is also available.
Популярные книги за неделю:
Проектирование и строительство. Дом, квартира, садАвтор: Петер Нойферт, Автор: Людвиг Нефф
Размер книги: 20.83 Mb
Nucleation (Butterworth 2000)Автор: Dimo KashchievКатегория: Phase transitions
Размер книги: 4.70 Mb
Система упражнений по развитию способностей человека (Практическое пособие)Автор: Петров Аркадий НаумовичКатегория: Путь к себе
Размер книги: 818 Kb
Сотворение мира (3-х томник)Автор: Петров Аркадий НаумовичКатегория: Путь к себе
Размер книги: 817 Kb
Радиолюбительские схемы на ИС типа 555Автор: Трейстер Р.Категория: Электротехника и связь
Размер книги: 13.64 Mb
Genki 1: An Integrated Course in Elementary Japanese 1Автор: Eri Banno, Автор: Yutaka Ohno, Автор: Yoko Sakane, Автор: Chikako Shinagawa, Автор:
Размер книги: 172.22 Mb
Только что пользователи скачали эти книги:
Encyclopedia of diagnostic imagingАвтор: Albert L. Baert, Автор: Albert L. Baert
Размер книги: 44.95 Mb
Vae Victis, tome 10 : Arulf l'IcenienАвтор: Simon Rocca, Автор: Jean-Yves Mitton
Размер книги: 21.15 Mb
Understanding the Process of Economic Change (Princeton Economic History of the Western World)Автор: Douglass C. NorthКатегория: История
Размер книги: 746 Kb
The First Jewish Revolt: Archaeology, History and IdeologyАвтор: Andrea M. Berlin, Автор: J. Andrew Overman (eds.)Категория: История
Размер книги: 6.28 Mb
Bailey & Scott's Diagnostic Microbiology, 12th Edition (Diagnostic Microbiology (Bailey & Scott's))Автор: Betty A. Forbes PhD D(ABMM) F(AAM), Автор: Daniel F. Sahm PhD D(ABMM) F(AAM), Автор: Alice S. Weissfeld PhD D(ABMM) F(AAM)
Размер книги: 177.86 Mb
Top 10 Barcelona (Eyewitness Top 10 Travel Guides)Автор: Annelise Sorensen, Автор: Ryan Chandler
Размер книги: 10.90 Mb
|
|
|