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Chemistry and Physics of Mechanical Hardness (Wiley Series on Processing of Engineering Materials)
Chemistry and Physics of Mechanical Hardness (Wiley Series on Processing of Engineering Materials)
John J. Gilman
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Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 15th Iberoamerican Congress on Pattern Recognition, CIARP 2010, São Paulo, Brazil, November 8-11, 2010, Proceedings (Lecture Notes in Computer Science)
Автор: Isabelle Bloch, Автор: Roberto M. Cesar Jr. (eds.)
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